T. V. Amotchkina
M. K. Trubetskov
A. V. Tikhonravov
S. Schlichting
H. Ehlers
D. Ristau
D. Death
R. J. Francis
V. Pervak

Quality control of oblique incidence optical coatings based on normal incidence measurement data

Optics Express
18
21
21508-21522
2013
Type: Zeitschriftenaufsatz (reviewed)
Abstract
We demonstrate selection of reliable approaches for postproduction characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.