An exhaustive study of laser damage in ion-beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations | Laser Zentrum Hannover

L. Gallais

B. Mangote

M. Commandré

M. Mende

L. O. Jensen

H. Ehlers

M. Jupé

D. Ristau

A. Melninkaitis

V. Sirutkaitis

S. Kicas

T. Tolenis

R. Drazdys

An exhaustive study of laser damage in ion-beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations

SPIE Laser Damage

23.-26. September

Boulder

2012

Type: Konferenzbeitrag

Abstract