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A. V. Tikhonravov
M. K. Trubetskov
M. A. Kokarev
T. V. Amotchkina
A. Duparré
E. Quesnel
D. Ristau
S. Günster

Influence of systematic errors in spectral photometric measurements on the determination of optical thin film parameters

Conference of Optical Interference Coatings (OIC)
15.-20. Juli
Banff
2001
Type: Konferenzbeitrag
Abstract

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