D. Ristau
H. Ehlers
T. Groß
M. Lappschies

Optical broadband monitoring of conventional and ion processes

Applied Optics
7
45
1495-1501
2006
Type: Zeitschriftenaufsatz (reviewed)
Abstract
This contribution is focused on applications of spectroscopic methods for the precise control of deposition processes. Besides a monochromator system with a moving grating for the deep ultraviolet∕vacuum ultraviolet (DUV∕VUV) spectral range, two approaches are presented for online spectrophotometers with CCD arrays. The conventional spectrophotometer is considered for the operator-assisted deposition of fluoride coatings applied in the DUV∕VUV range. The concepts with CCD arrays are combined with an advanced software tool for an automatic production of optical coatings. An ion-assisted deposition process and ion-beam sputtering are considered for rapid manufacturing of complex layer systems in the visible and near-infrared spectral ranges. The present contribution summarizes and discusses the major aspects of the described combinations.