A. Melninkaitis
M. Martynas Keršys
L. Smalakys
G. Batavičiūtė
E. Pupka
J. Galinis
M. Jupé
C. Engesser
L. Lamaignère
D. Ristau

Recent advancements in standardization effort for laser-induced damage threshold testing

Proc. SPIE 13020, Advances in Optical Thin Films VIII
94-100
2024
Type: Zeitschriftenaufsatz (non-reviewed)
Abstract
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