Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films
SPIE Laser Damage
23.-25. September
Boulder
2009
Type: Konferenzbeitrag
DOI: 10.1117/12.836508
Abstract
In this contribution we will summarize the fundamental mechanisms that lead to subpicosecond laser damage in dielectric films, discuss the resulting scaling laws of single pulse (1-on-1) damage with respect to pulse duration and bandgap, of the multiple pulse (S-on-1) damage threshold as a function of pulse number, and compare these findings to recent experimental results.